Autor/es:
Hoshino T, Uchiyama S, Wong LKS, Kitagawa K, Charles H, Labreuche J, Lavallée PC, Albers GW, Caplan LR, Donnan GA, Ferro JM, Hennerici MG, Molina C, Rothwell PM, Gabriel Steg P, Touboul PJ, Vicaut É, Amarenco P; TIA registry.org Investigators.